X-Ray Fluorescence Analysis

For elemental determinations

The x-ray fluorescence (XRF) facility at the CAIS focuses primarily on elemental analyses of geological and anthropological materials. In addition to this capability for conventional matrix-matched standards-based analyses, we use a powerful Fundamental Parameters algorithm that enables analysis of unusual or oddly shaped samples such as artifacts, semiconductor materials, air quality (particulate) samples, or virtually any solid material of sufficient size.

The XRF facility is anchored by a Philips (Panalytical) wavelength-dispersive sequential spectrometer that is fitted with flow and scintillation detectors coupled with a variety of crystals for multi-element analysis. Usually, samples are prepared for major element analysis by the borate fusion method, and for trace element analysis using pressed pellets, but we can adapt the preparation method to suit your particular material.

Selected Images :: Instrumentation :: Analytical Costs :: Sample Submission 

For further information contact Dr. Doug Dvoracek (706) 542-6136